Publications – Mustapha Ouladsine

Publications et production scientifique

Globalement mon bilan scientifique se résume à :

138 Colloques internationaux avec comités de lecture et actes, dont 37 dans la période 2013-2019
38 articles dans des revues Internationales, dont 16 dans la période 2013-2019
9 Colloques nationaux
3 chapitres d’ouvrages
2 revues nationales

Dans la liste ci-dessous je ne présente que les publications depuis janvier 2013.

Articles dans des revues d’audience internationale :

Mohammed Al-kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal and Jacques Pinaton. Product End Quality Virtual Inspection based on Alarm Events Data: Application to a Semiconductor Industry. ISA Transactions 2019
Chaibi Redouane, Tissir El Houssaine, Abdelaziz Hmamed, El Mostafa El Adel, Mustapha Ouladsine. STATIC OUTPUT FEEDBACK CONTROLLER FOR CONTINUOUS-TIME FUZZY SYSTEMS.International Journal of Innovative Computing, Information and Control, ICIC International, 2019, 15 (4)
Ayyoub Ait Ladel , Abdellah Benzaouia , Rachid Outbib , Mustapha Ouladsine Integrated sensor fault estimation and control for continuous-time switched systems: a new separation principle: ISA Transaction 2019
Ayyoub Ait Ladel , Abdellah Benzaouia, Rachid Outbib , Mustapha Ouladsine Robust fault tolerant control of continuous-time switched systems: An LMI approach. journal « Nonlinear Analysis: Hybrid Systems ». Accepted for 2019
Youssef Eddoukali, A. Benzaouia & M; Ouladsine, Integrated fault detection and control design for continuous time switched systems under asynchronous switching, ISA Transactions 1018
Baligh MNASSRI – El mostafa EL ADEL – Mustapha OULADSINE, Analysis and comparison of an improved unreconstructed variance criterion to other criteria for estimating the dimension of PCA model » , in : Journal of Process Control, Vol. 44, pp. 207–223, juin 2016
Thi bich lien NGUYEN – Mohand DJEZIRI – Bouchra ANANOU – Mustapha OULADSINE – Jacques PINATON » Fault prognosis for batch production based on percentile measure and gamma process: Application to semiconductor manufacturing ». in : Journal of Process Control, vol 48, , pp72-80, decembre 2016
Mohamad CHAKAROUN – Mohand DJEZIRI – Mustapha OULADSINE – Jacques PINATON « Reactive Sampling for efficient Defect Source Identification » , in : IEEE Transactions on Semiconductor Manufacturing, Vol. PP, Issue:99, pp. 1, mar 2016
Thi bich lien NGUYEN – Mohand DJEZIRI – Bouchra ANANOU – Mustapha OULADSINE – Jacques PINATON « Health index extraction methods for batch processes in semiconductor manufacturing » , in : IEEE Transactions on Semiconductor Manufacturing, Vol. 18-ISSUE 3, pp. 306-317 2015
David GUCIK – Rachid OUTBIB – Mustapha OULADSINE « A comparative study of unknown-input observers for prognosis applied to an electromechanical system » , in : IEEE Transactions on Reliability (IF 2,30) , PP, Issue:99, pp. 1-14, sep 2015
Baligh MNASSRI – El mostafa EL ADEL – Mustapha OULADSINE « Reconstruction-based contribution approaches for improved fault diagnosis using principal component analysis » , in : Journal of Process Control, Vol. 33, pp. 60-76, jui 2015
Hassan MOUSSA-NAHIM – Younes RAFIK – Mustapha OULADSINE « Complete modeling for systems of marine diesel engine » , in : Journal of Marine Science and Application , Vol. vol 14, Issue 1, pp. pp 93-104, mar 2015
Abdellah BENZAOUIA – Youssef EDDOUKALI – Mustapha OULADSINE « Fault Detection for Switching Discrete Time Systems with External Disturbance » , in : International Journal Circuits Syst Signal Process , Vol. DOI 10.1007/s00034-014-9961-8, jan 2015
Abdellah BENZAOUIA – Mustapha OULADSINE – Bouchra ANANOU « Fault Tolerant Control for delayed Switching Discrete -time Systems : An Improved Cone Complementarity Approach » , in : International Journal of Systems Science , Vol 45 Issue 10 pp 2116-2126, 2014
Abdellah BENZAOUIA – Mustapha OULADSINE – Bouchra ANANOU « Fault-tolerant satured control for switching discrete time systems with delays » , in : International Journal of Adaptive Control and Signal Processing , Vol. Vol 14, DOI : 10.1002/acs.2532, dec 2014
Baligh MNASSRI – El mostafa EL ADEL – Mustapha OULADSINE « Generalization and analysis of sufficient conditions for PCA-based fault detectability and isolability » , in : Annual Reviews in Control, Vol. 37 (1), pp. 154-162, mai 2013
Mohand DJEZIRI – Mustapha OULADSINE – Rochdi MERZOUKI – Belkacem OULD BOUAMAMA « Fauld diagnosis and fault tolerent control of an electric Vehicle over-actuated » , in : IEEE Transaction on Vehicular Technology, Vol. 62 (3), pp. 986 – 994, fev 2013

Conférences internationales avec actes et comité de lecture

Samia MELLAH, Guillaume GRATON, El Mostafa EL ADEL, Mustapha OULADSINE and Alain PLANCHAIS. Detection & isolation of sensor and actuator additive faults in a 4-mecanum wheeled mobile robot (4-MWMR). 3e édition « International Conference on Control, Automation and Diagnosis », ICCAD’19. 2 – 4 juillet 2019, Grenoble, France.
Samia MELLAH, Guillaume GRATON, El Mostafa EL ADEL, Mustapha OULADSINE and Alain PLANCHAIS . Mobile robot additive fault diagnosis and accommodation. The 8^th IEEE ICSC’19. 23-25 October 2019, Marrakech, Moroco.
Ayyoub Ait Ladel , Abdellah Benzaouia,, Rachid Outbib , Mustapha Ouladsine , Fault Tolerant Saturated Control for T-S Fuzzy Discrete-time Systems with Delays and Uncertainties. ACD’19. Bologna, Italy, 21-22 November 2019
Samia MELLAH, Guillaume GRATON, El Mostafa EL ADEL, Mustapha OULADSINE and Alain PLANCHAIS. Trajectory tracking and time delay management of 4-mecanum wheeled mobile robots (4-MWMR), IFAC, 15th European Workshop on Advanced Control and Diagnosis, ACD’19. Bologna, Italy, 21-22 November 2019
Haddi, B. Ananou, Y. Trardi, J-F. Pons, S. Delliaux, M. Ouladsine, and J-C. Deharo, Relevance Vector Machine as Data-Driven Method for Medical Decision Making, European Control Conference, 1011-1016, 2019
Youssef Trardi*, Bouchra Ananou, Zouhair Haddi, Mustapha Ouladsine. An Effective Data-Driven Diagnostic Strategy for Cardiac Pathology Screening. 15th European Workshop on Advanced Control and Diagnosis, ACD’19. Bologna, Italy, 21-22 November 2019
Mohammed Al-kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal and Jacques Pinaton. Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing 6th International Conference on Control, Decision and Information Technologies (CoDIT’2019) April, 23-26, 2019, France, Paris
Mohammed Al-kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal and Jacques Pinaton. Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artiﬁcial Neural Network, The 8^th IEEE ICSC’19. 23-25 October 2019, Marrakech, Moroco
Mohammed Al-kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal and Jacques Pinaton. Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing. 58th IEEE Conference on Decision and Control (CDC 2019). December 11-13 2019, France, Nice
Samia MELLAH, Guillaume GRATON, El Mostafa EL ADEL, Mustapha OULADSINE, Alain PLANCHAIS. On fault detection and isolation applied on unicycle mobile robot sensors and actuators. The 7^th October 24-26 ICSC2018, Valencia, Spain.
Trardi ; B. Ananou ; Z. Haddi ; M. Ouladsine , Multi-Dynamics Analysis of QRS Complex for Atrial Fibrillation Diagnosis . 5th IEEE International Conference on Control, Decision and Information Technologies (CoDIT 2018) Page s: 1067 – 1072. April 10-13, 2018 Thessaloniki, Greece.
Trardi ; B. Ananou ; Z. Haddi ; M. Ouladsine A Novel Method to Identify Relevant Features for Automatic Detection of Atrial Fibrillation. 2018 26th IEEE Mediterranean Conference on Control and Automation (IEEE MED). Zadar, Croati, June 19-22, 2018.
Korabi, Taki Eddine Graton, Guillaume), El Adel, El mostafa, Ouladsine, Mustapha, Pinaton, Jacques Control 2018: Industrial Risk-Based Indicator for Dynamic Sampling in Semiconductor Manufacturing. Control 2018: The 12th International UKACC Conference on Control. 5-7 Sept 2018, Sheffield, UK
Taki Eddine KORABI ; Guillaume Graton ; El Mostafa El Adel ; Mustapha Ouladsine ; Jacques Pinaton A Bayesian indicator for Run-to-Run performance assessment in semiconductor manufacturing. 2018 14th IEEE Conference on Ph.D. Research in Microelectronics and Electronics (IEEE PRIME), Page s: 53 – 56, 2-5 July 2018, Prague, CZECH Republic
Taki Eddine Korabi ; Guillaume Graton ; El Mostafa El Adel ; Mustapha Ouladsine ; Jacques Pinaton On the increase of the controllability matrix rank in non-threaded run-to-run control. 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC). Page s: 340 – 34530April-3 May 2018, New York, USA.
Zouhair Haddi, Bouchra Ananou, Youssef Trardi, Jean-François Pons, Stéphane Delliaux, Mustapha Ouladsine, Jean-Claude Deharo, An Efficient Pattern Recognition Kernel-Based Method for Atrial Fibrillation Diagnosis, Computing in Cardiology, vol. 45, 1–4, 2018.
Benzaouia, Abdellah, Telbissi, Kenza, Ouladsine Mustapha, Ananou, Bouchra , Based Observer Fault Detection for Uncertain Delayed Switching Discrete-Time Systems: A Reduced LMI Size. 2017 25th IEEE Mediterranean Conference on Control and Automation (MED). 3-6 July 2017, Valletta, Malta.
Mohamed ali JEBRI – El mostafa EL ADEL – Guillaume GRATON – Mustapha OULADSINE – Jacques PINATON. « The Effect of the Virtual Metrology on a Run-to-Run control for a Chemical Mechanical Planarization process » , in : IFAC 2017 World Congress, jui 2017
MariamMelhem ; Bouchra Ananou ; Mustapha Ouladsine ; Michel Combal ; Jacques Pinaton Analysis of similarities between alarm events in the semiconductor manufacturing process. Page s: 888 – 894, 2017 25th IEEE Mediterranean Conference on Control and Automation (IEEE MED). 3-6 July 2017, Valletta, Malta.
MariamMelhem ; Bouchra Ananou ; Mustapha Ouladsine; Michel Combal; Jacques Pinaton Product quality prediction using alarm data : Application to the semiconductor manufacturing process, Page s: 1332 – 1338, 25th IEEE Conferences Mediterranean Conference on Control and Automation (IEEE MED). 3-6 July 2017, Valletta, Malta.
Zouhair Haddi, Jean-François Pons, Stéphane Delliaux, Bouchra Ananou, Jean-Claude Deharo, Ahmed Charaï, Rachid Bouchakour, Mustapha Ouladsine, A Robust Detection Method of Short Atrial Fibrillation Episodes, Computing in Cardiology, vol. 44, 1–4, 2017.
Jean-François Pons, Zouhair Haddi, Jean-Claude Deharo, Ahmed Charaï, Rachid Bouchakour, Mustapha Ouladsine, Stéphane Delliaux, Heart rhythm characterization through induced physiological variables, Scientific Reports, 7:5059, 1–13, 2017.
Julien Marino, Francesco Rossi, mustapha ouladsine, Jacques Pinaton « Unsupervised Semiconductor Chamber Matching based on shape comparison » The 20th World Congress of the International Federation of Automatic Control, 9-14 July 2017, Toulouse France.
Mohamed Ali Jebri, El Mostafa EL ADEL, Guillaume Graton, mustapha ouladsine, Jacques Pinaton « The Effect of the Virtual Metrology on a Run-to-Run control for a Chemical Mechanical Planarization process » The 20th World Congress of the International Federation of Automatic Control, 9-14 July 2017, Toulouse France.
Julien MARINO – Francesco ROSSI – Mustapha OULADSINE – Jacques PINATON « Gaussian Time Error: a fault detection index for semiconductor processes » , American Control Conference 2016, jui 2016
Zouhair Haddi, Stephane Delliaux, Jean-Francois Pons, Ismail Kechaf, Jean-Claude Deharo, Mustapha Ouladsine, Multivariate Data Analysis for Automatic Atrial Fibrillation Detection, accepted for Oral presentation in 18th International Conference on Telecare and Telemedicine, Miami, USA, December 05-06, 2016
Mariam MELHEM – Bouchra ANANOU – Mustapha OULADSINE – Jacques PINATON « Regression methods for predicting the product’s quality in the semiconductor manufacturing process » , 8th IFAC Conference on Manufacturing Modelling, Management and Control, Troyes, jui 2016
Mariam MELHEM – Bouchra ANANOU – Mustapha OULADSINE – Jacques PINATON « Regularized regression models to predict the product quality in multistep manufacturing » , International Conference on Systems and Control, mai 2016
Mohamed ali JEBRI – Guillaume GRATON – El mostafa EL ADEL – Mustapha OULADSINE – Jacques PINATON « Virtual Metrology on Semiconductor Manufacturing Based on Just-In-Time Learning » , 8th IFAC Conference on Manufacturing Modelling, Management and Control, Troyes, avr 2016
El mostafa EL ADEL – Guillaume GRATON – Mustapha OULADSINE – Jacques PINATON » Run To Run control based on categorical output in semiconductor manufacturing » , International Conference on Systems and Control, ICSC’2016, Marrakech, avr 2016
Mohamed ali JEBRI – El mostafa EL ADEL – Guillaume GRATON – Mustapha OULADSINE – Jacques PINATON « Virtual metrology based on relevant features extraction and Just-In-Time Learning approach » , Advanced Process Control at the 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2016), New-York, avr 2016
Mohamed ali JEBRI – Guillaume GRATON – El mostafa EL ADEL – Mustapha OULADSINE – Jacques PINATON « Virtual metrology on chemical mechanical planarization process based on Just-in-time learning » , International Conference on Systems and Control, ICSC’2016, Marrakech, avr 2016
Guillaume GRATON – El mostafa EL ADEL – Mustapha OULADSINE – Jacques PINATON « Online Optimized Parameters for RLS-LT Controller – Application to Processes with Mixed Products and Feature Aging » , International Conference on Systems and Control, ICSC’2016, Marrakech, avr 2016
Thi bich lien NGUYEN – Mohand DJEZIRI – Bouchra ANANOU – Mustapha OULADSINE- Jacques PINATON « Remaining Useful Life estimation for noisy degradation trends » , 9th IFAC Symposium on Fault Detection, Supervision (SAFEPROCESS), IFAC, Paris, France, sep 2015
Mariam MELHEM – Bouchra ANANOU – Mohand DJEZIRI – Mustapha OULADSINE – Jacques PINATON « Prediction of the Wafer quality with respect to the production equipments data » , 9th IFAC Symposium on Fault Detection, Supervision (SAFEPROCESS), IFAC, Arts et métiers Polytech, Paris, France, sep 2015
Thi bich lien NGUYEN – Mohand DJEZIRI – Bouchra ANANOU – Mustapha OULADSINE – Jacques PINATON « Degradation modelling with operating mode changes » , in : IEEE, 2015 IEEE International Conference on. Prognostics and Health Management, Austin, Texas, USA, jui 2015
Mohamad CHAKAROUN – Mohand DJEZIRI – Mustapha OULADSINE – Jacques PINATON « Defect Diagnosis Using In Line Product Control Data In Semiconductor Industry » , The 4th International Conference on Systems and Control, avr 2015
Mohamad CHAKAROUN – Mohand DJEZIRI – Mustapha OULADSINE – Jacques PINATON « Qualitative Diagnosis Method Based on Process History in Semiconductor Manufacturing Process » , The 19th World Congress of the International Federation of Automatic Control, aou 2014
Thi bich lien NGUYEN – Mohand DJEZIRI – Bouchra ANANOU – Mustapha OULADSINE – Jacques PINATON « Fault prognosis for Discrete Manufacturing Processes » , The 19th World Congress of the International Federation of Automatic Control, pp. 7 pages, aou 2014
Thi bich lien NGUYEN – Mohand DJEZIRI – Bouchra ANANOU – Mustapha OULADSINE – Jacques PINATON « Fault Prognosis with Stochastic Modelling on Critical Points of Discrete Processes » , Second European Conference of the Prognostics and Health Management Society 2014, Prognostics and Health Management Society, jui 2014
Mohamad CHAKAROUN – Mohand DJEZIRI – Mustapha OULADSINE – Jacques PINATON « Similar Sample Selection approach Based on Sequence Alignment; Application to semiconductor industry » , The 22nd Mediterranean Conference on Control & Automation, jui 2014
Mohand DJEZIRI – Mustapha OULADSINE – Bouchra ANANOU « Data driven and model based fault prognosis applied to a mechatronic system » , International Conference on Power Engineering, Energy and Electrical Drives, IEEE, Vol. ISBN= 978-1-4673-6390-7, pp. 534 – 539 , mar 2013.